File:SweepMe-1.5.1.12 screeshot-loop-measurement.PNG: Difference between revisions

Latest revision as of 15:15, 5 August 2018

Summary

Stress test measurement of new transistor technology with more than 300 cycles.

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	Date/Time	Thumbnail	Dimensions	User	Comment
current	09:16, 24 July 2018		1,680 × 1,003 (199 KB)	FelixD (talk \| contribs)	Stress test measurement of new transistor technology with more than 300 cycles.

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Horizontal resolution	37.79 dpc
Vertical resolution	37.79 dpc
File change date and time	06:51, 23 July 2018

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 == Licensing ==
 {{self|cc-zero}}
+[[Category:Screenshots]]