Examples: Difference between revisions
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* Sensitive EQE measurements | * Sensitive EQE measurements | ||
* Thin film deposition in vacuum chambers | * Thin film deposition in vacuum chambers | ||
* | * Wafer prober tests | ||
* Temperature dependent material and device characterization | * Temperature dependent material and device characterization | ||
* Cyclic battery and memory tests | |||
Revision as of 15:08, 20 January 2023
Please find below some typical examples and use cases:
- Logging of sensor values, e.g. temperature, pressure, and humidity
- Current-voltage characteristics, e.g. LEDs, solar cells, and transistors
- Angle dependent spectra, e.g. to characterize light sources
- Sensitive EQE measurements
- Thin film deposition in vacuum chambers
- Wafer prober tests
- Temperature dependent material and device characterization
- Cyclic battery and memory tests