Examples
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Please find below some typical examples and use cases:
- Logging of sensor values, e.g. temperature, pressure, and humidity
- Current-voltage characteristics, e.g. LEDs, solar cells, and transistors
- Angle dependent spectra, e.g. to characterize light sources
- Sensitive EQE measurements
- Thin film deposition in vacuum chambers
- wafer prober tests
- Temperature dependent material and device characterization