Examples

SweepMe! can be used for sheer number of academic and industrial measurements and processes, from a simple reading of a temperature sensor to sample fabrication by physical vapor deposition in a vacuum chamber. A few example use-cases are presented in this article. However, the possibilities are indeed unlimited! As the retired NASA astronaut Ron Garan once said, “We are limited only by our imagination and our will to act”.

For each use-case, a self-explanatory example sequencer is given, with a short explanation. One can configure the Modules by double-clicking on them in the Sequencer window. In this article, the Sequencer is depicted with the free online ASCII tree-generator tool tree.

Current-voltage characteristics

One SMU module is all you need for the quickest, simplest current-voltage curve of a semiconductor device like an LED, a solar cell, or a transistor! By adding a second SMU, one can measure the characteristic curves of two-port networks and devices. Don't forget to input the sweep range of SMU(s) in the sweep values window of the module!

MakeFile
└── SMU-Keithley_2400
    └── SMU-Keithley_2400  # e.g. for transistors characteristic curve

Sensor monitoring system

A microcontroller board like Arduino can come in handy as an interface between sensors and computers. There are different SweepMe! drivers accompanied with Arduino .ino sketch files to read common sensors. In the example below, a DHT temperature and relative humidity sensor is read with the Logger-Arduino_DHTxx driver in a certain interval, defined by delay. The data then is published with popular IoT protocol MQTT over the local network. For more information, please refer to Arduino Driver guide and MQTT articles.

MakeFile
└── Loop
    └── Logger-Arduino_DHTxx
        └── MQTT
            └── Delay

Angle dependent spectra

MakeFile
└── Switch
    └── SMU

Sensitive EQE measurements

• Sensitive EQE measurements

Vacuum thin film deposition

MakeFile
└── Logger-Leybold_CombivacCM31					# pressure meter
    └── Logger-Inficon-SQM-160					# deposition rate monitor
        └── Switch-Yoctopuce_Yocto-Relay		# pneumatic shutter
            └── PID								# PID module to stabilize the deposition rate
                └── Temperature-Eurotherm-22xx	# temperature controller for material crucible
                    └── Condition				# A condition to open the shutter at the right deposition rate

Wafer prober tests and measurements

• Wafer prober tests

Temperature dependent material and device characterization

• Temperature dependent material and device characterization

Cyclic battery tests

• Cyclic battery and memory tests