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{{FlexBoxItemColorBox|title=Ports|dark=#96f4ff|light=#bff8|
{{FlexBoxItemColorBox|title=Examples|dark=#c47825|light=#ffe7d9|
* [[Supported ports]]
* [[Examples|Current-voltage characteristics]]
* [[VISA runtime]]
* [[Examples|Cyclic battery tests]]
* [[Protocols]]
* [[Examples|Sensor monitoring system]]
* [[Examples|Angle dependent spectra]]
* [[Examples|Device lifetime and material degradation characterization]]
* [[Examples|Sensitive EQE measurements]]
* [[Examples|Wafer prober tests and measurements]]
* [[Examples|Vacuum thin film deposition]]
}}
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{{FlexBoxItemColorBox|title=Examples|dark=#96f4ff|light=#bff8|
{{FlexBoxItemColorBox|title=Ports|dark=#96f4ff|light=#bff8|
* [[Supported ports]]
* [[Supported ports]]
* [[VISA runtime]]
* [[VISA runtime]]

Revision as of 11:52, 21 April 2023